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dc.creatorGuerra, Oscar-
dc.creatorEscalera, Sara-
dc.creatorRosa, José M. de la-
dc.creatorCompaigne, Eric-
dc.creatorGalliard, Christophe-
dc.creatorRodríguez-Vázquez, Ángel-
dc.date2008-04-29T05:49:23Z-
dc.date2008-04-29T05:49:23Z-
dc.date2000-11-
dc.date.accessioned2017-01-31T01:05:42Z-
dc.date.available2017-01-31T01:05:42Z-
dc.identifierO. Guerra, S. Escalera, J.M. de la Rosa, E. Compaigne, C. Galliard and A. Rodríguez-Vázquez: "Selection of test techniques for high-resolution ΣΔ modulators”, Proceeding of the 2004 Conference on Design of Circuits and Integrated Systems, pp. 211-214, Bordeaux, November 2004.-
dc.identifier2-9522971-0-X-
dc.identifierhttp://hdl.handle.net/10261/3845-
dc.identifier.urihttp://dspace.mediu.edu.my:8181/xmlui/handle/10261/3845-
dc.descriptionThis paper introduces a new tool which allows the evaluation of different test techniques in a complete impartial manner. This tool has been applied to the selection of the best test technique for their application to high-resolution ΣΔ modulators. Besides, three of these techniques have been presented.-
dc.descriptionThis work has been supported by the EU ESPRIT IST Project 2001-34283/TAMES_2 and the spanish CICYT Project TIC - 2001-0929/ADAVERE.-
dc.descriptionPeer reviewed-
dc.format215836 bytes-
dc.formatapplication/pdf-
dc.languageeng-
dc.rightsopenAccess-
dc.subjectTest-
dc.subjectSigma-Delta Modulators-
dc.titleSelection of test techniques for high-resolution ΣΔ modulators-
dc.typeArtículo-
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