Please use this identifier to cite or link to this item:
http://dspace.mediu.edu.my:8181/xmlui/handle/10261/3845| Title: | Selection of test techniques for high-resolution ΣΔ modulators |
| Keywords: | Test Sigma-Delta Modulators |
| Description: | This paper introduces a new tool which allows the
evaluation of different test techniques in a complete impartial manner. This tool has been applied to the selection of the best
test technique for their application to high-resolution ΣΔ modulators. Besides, three of these techniques have been presented. This work has been supported by the EU ESPRIT IST Project 2001-34283/TAMES_2 and the spanish CICYT Project TIC - 2001-0929/ADAVERE. Peer reviewed |
| URI: | http://dspace.mediu.edu.my:8181/xmlui/handle/10261/3845 |
| Other Identifiers: | O. Guerra, S. Escalera, J.M. de la Rosa, E. Compaigne, C. Galliard and A. Rodríguez-Vázquez: "Selection of test techniques for high-resolution ΣΔ modulators”, Proceeding of the 2004 Conference on Design of Circuits and Integrated Systems, pp. 211-214, Bordeaux, November 2004. 2-9522971-0-X http://hdl.handle.net/10261/3845 |
| Appears in Collections: | Digital Csic |
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