Please use this identifier to cite or link to this item: http://dspace.mediu.edu.my:8181/xmlui/handle/10261/4299
Title: Anisotropic conductivity of silver thin films grown on silicon (100) vicinal surfaces
Keywords: Thin films
Publisher: American Institute of Physics
Description: The electrical conductivity between 4 and 300 K of Ag thin films (up to 30 mm grown at room temperature on Si(100) vicinal surfaces has been measured and their morphology imaged with an atomic force microscope. A noticeable anisotropy of the resistivity of the films which is related to the structure of the films has been found)
Laboratories du CNRS Departamento de Física Materia Condensada. Universidad Autónoma.
Peer reviewed
URI: http://dspace.mediu.edu.my:8181/xmlui/handle/10261/4299
Other Identifiers: Appl. Phys. Lett. 66 (4), 529 (1995)
003-6951
http://hdl.handle.net/10261/4299
Appears in Collections:Digital Csic

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