Anisotropic conductivity of silver thin films grown on silicon (100) vicinal surfaces

Please use this identifier to cite or link to this item: http://dspace.mediu.edu.my:8181/xmlui/handle/10261/4299

Full metadata record

DC Field	Value	Language
dc.creator	López-Ríos, T.	-
dc.creator	Briggs, A	-
dc.creator	Guillet, S.	-
dc.creator	Baró, A. M.	-
dc.creator	Luna, Mónica	-
dc.date	2008-05-16T09:42:28Z	-
dc.date	2008-05-16T09:42:28Z	-
dc.date	1995-01-23	-
dc.date.accessioned	2017-01-31T01:20:27Z	-
dc.date.available	2017-01-31T01:20:27Z	-
dc.identifier	Appl. Phys. Lett. 66 (4), 529 (1995)	-
dc.identifier	003-6951	-
dc.identifier	http://hdl.handle.net/10261/4299	-
dc.identifier.uri	http://dspace.mediu.edu.my:8181/xmlui/handle/10261/4299	-
dc.description	The electrical conductivity between 4 and 300 K of Ag thin films (up to 30 mm grown at room temperature on Si(100) vicinal surfaces has been measured and their morphology imaged with an atomic force microscope. A noticeable anisotropy of the resistivity of the films which is related to the structure of the films has been found)	-
dc.description	Laboratories du CNRS Departamento de Física Materia Condensada. Universidad Autónoma.	-
dc.description	Peer reviewed	-
dc.format	143459 bytes	-
dc.format	application/pdf	-
dc.language	eng	-
dc.publisher	American Institute of Physics	-
dc.rights	openAccess	-
dc.subject	Thin films	-
dc.title	Anisotropic conductivity of silver thin films grown on silicon (100) vicinal surfaces	-
dc.type	Artículo	-
Appears in Collections:	Digital Csic

Files in This Item:

There are no files associated with this item.

DSpace JSPUI