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DC Field | Value | Language |
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dc.creator | Rubinger R.M. | - |
dc.creator | Oliveira A.G. de | - |
dc.creator | Ribeiro G.M. | - |
dc.creator | Bezerra J.C. | - |
dc.creator | Silva C.M. | - |
dc.creator | Rodrigues W.N. | - |
dc.creator | Moreira M.V.B. | - |
dc.date | 1999 | - |
dc.date.accessioned | 2013-05-29T23:36:26Z | - |
dc.date.available | 2013-05-29T23:36:26Z | - |
dc.date.issued | 2013-05-30 | - |
dc.identifier | http://www.scielo.br/scielo.php?script=sci_arttext&pid=S0103-97331999000400038 | - |
dc.identifier | http://www.doaj.org/doaj?func=openurl&genre=article&issn=01039733&date=1999&volume=29&issue=4&spage=793 | - |
dc.identifier.uri | http://koha.mediu.edu.my:8181/jspui/handle/123456789/2805 | - |
dc.description | In this work we present studies for the behavior of impurity breakdown of two GaAs samples grown by Molecular Beam Epitaxy at 200°C and 300°C. We vary the temperature and the illumination intensity. For the sample grown at 200°C, the transport mechanism after the breakdown is of the same type of the main free carriers at low electric fields. Below 100K, a clear dependence of the threshold electric field with temperature was observed. The sample grown at 300°C shows a breakdown due to an acceptor level at 41meV from the valence band. The threshold electric field increases with illumination due to the generation of free electrons by deep levels. A similar behavior was also observed for a Cr doped GaAs sample. | - |
dc.publisher | Sociedade Brasileira de Física | - |
dc.source | Brazilian Journal of Physics | - |
dc.title | Impurity breakdown in GaAs samples grown by molecular beam Epitaxy | - |
Appears in Collections: | Physics and Astronomy |
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