Infrared analysis of thin films: amorphous, hydrogenated carbon on silicon

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DC Field	Value	Language
dc.creator	Jacob Wolfgang	-
dc.creator	Keudell Achim vom	-
dc.creator	Schwarz-Selinger Thomas	-
dc.date	2001	-
dc.date.accessioned	2013-05-30T00:44:41Z	-
dc.date.available	2013-05-30T00:44:41Z	-
dc.date.issued	2013-05-30	-
dc.identifier	http://www.scielo.br/scielo.php?script=sci_arttext&pid=S0103-97332001000100019	-
dc.identifier	http://www.doaj.org/doaj?func=openurl&genre=article&issn=01039733&date=2001&volume=31&issue=1&spage=109	-
dc.identifier.uri	http://koha.mediu.edu.my:8181/jspui/handle/123456789/3162	-
dc.publisher	Sociedade Brasileira de Física	-
dc.source	Brazilian Journal of Physics	-
dc.title	Infrared analysis of thin films: amorphous, hydrogenated carbon on silicon	-
Appears in Collections:	Physics and Astronomy

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