Please use this identifier to cite or link to this item: http://dspace.mediu.edu.my:8181/xmlui/handle/123456789/3392
Title: Influence of annealing on the optical and electrical properties of multilayered InAs/GaAs quantum dots
Issue Date: 30-May-2013
Publisher: Sociedade Brasileira de Física
Description: The characteristics of multi-layered InAs/GaAs self assembled quantum dots (SAQDs) annealed after the growth were here studied using a combination of capacitance-voltage (C-V) measurements,Raman scattering and photoluminescence (PL) spectroscopy. The combination of the results obtained with the three techniques, gave evidences that the annealing at 500º C causes the sharpness of the SAQDs interfaces, while the annealing at 600º C eliminated the SAQDs. However, the comparison with the case of single layered SAQDs, revealed a thermal stability of the last system even at an annealing temperature of 700º C, thus confirming the role of the interlayer strain in the low temperature diffusion process.
URI: http://koha.mediu.edu.my:8181/jspui/handle/123456789/3392
Other Identifiers: http://www.scielo.br/scielo.php?script=sci_arttext&pid=S0103-97332002000200009
http://www.doaj.org/doaj?func=openurl&genre=article&issn=01039733&date=2002&volume=32&issue=2a&spage=287
Appears in Collections:Physics and Astronomy

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