Please use this identifier to cite or link to this item: http://dspace.mediu.edu.my:8181/xmlui/handle/123456789/3436
Title: In-situ determination of indium segregation in InGaAs/GaAs quantum wells grown by molecular beam epitaxy
Issue Date: 30-May-2013
Publisher: Sociedade Brasileira de Física
Description: The surface segregation of indium atoms during the growth of InGaAs/GaAs heterostructures has been investigated in situ by reflection high-energy electron diffraction (RHEED). We pointed out that strong damping of the RHEED oscillations during the deposition of InGaAs on GaAs was related to the segregation strength of indium atoms in the InGaAs layer. A simple model shows that the decay constant of the RHEED oscillations may be used to determine accurately the segregation coefficient R, as confirmed by photoluminescence (PL) measurements.
URI: http://koha.mediu.edu.my:8181/jspui/handle/123456789/3436
Other Identifiers: http://www.scielo.br/scielo.php?script=sci_arttext&pid=S0103-97332002000200031
http://www.doaj.org/doaj?func=openurl&genre=article&issn=01039733&date=2002&volume=32&issue=2a&spage=359
Appears in Collections:Physics and Astronomy

Files in This Item:
There are no files associated with this item.


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.