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http://dspace.mediu.edu.my:8181/xmlui/handle/123456789/4093| Title: | Defeitos superficiais em 2H-WS2 observados por microscopia de tunelamento |
| Keywords: | scanning tunnelling microscopy tungsten disulphide catalysis |
| Issue Date: | 30-May-2013 |
| Publisher: | Sociedade Brasileira de Química |
| Description: | Scanning tunnelling microscopy (STM) was used to characterise the basal surface of fresh cleaved crystals of 2H-WS2. Although no impurity or stacking faults could be detected by X-ray diffraction, STM images obtained with negative bias voltage showed two kinds of defects. These defects were attributed to an iodine derivative used as transport agent. In a flat surface free of defects, an image with atomic resolution was achieved with sulphur distances and angles as expected for hexagonal symmetry of 2H-WS2. |
| URI: | http://koha.mediu.edu.my:8181/jspui/handle/123456789/4093 |
| Other Identifiers: | http://www.scielo.br/scielo.php?script=sci_arttext&pid=S0100-40421998000100001 http://www.doaj.org/doaj?func=openurl&genre=article&issn=01004042&date=1998&volume=21&issue=1&spage=5 |
| Appears in Collections: | Chemistry |
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