Defeitos superficiais em 2H-WS2 observados por microscopia de tunelamento

Please use this identifier to cite or link to this item: http://dspace.mediu.edu.my:8181/xmlui/handle/123456789/4093

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DC Field	Value	Language
dc.creator	Wypych F.	-
dc.creator	Weber Th.	-
dc.creator	Prins R.	-
dc.date	1998	-
dc.date.accessioned	2013-05-30T10:36:09Z	-
dc.date.available	2013-05-30T10:36:09Z	-
dc.date.issued	2013-05-30	-
dc.identifier	http://www.scielo.br/scielo.php?script=sci_arttext&pid=S0100-40421998000100001	-
dc.identifier	http://www.doaj.org/doaj?func=openurl&genre=article&issn=01004042&date=1998&volume=21&issue=1&spage=5	-
dc.identifier.uri	http://koha.mediu.edu.my:8181/jspui/handle/123456789/4093	-
dc.description	Scanning tunnelling microscopy (STM) was used to characterise the basal surface of fresh cleaved crystals of 2H-WS2. Although no impurity or stacking faults could be detected by X-ray diffraction, STM images obtained with negative bias voltage showed two kinds of defects. These defects were attributed to an iodine derivative used as transport agent. In a flat surface free of defects, an image with atomic resolution was achieved with sulphur distances and angles as expected for hexagonal symmetry of 2H-WS2.	-
dc.publisher	Sociedade Brasileira de Química	-
dc.source	Química Nova	-
dc.subject	scanning tunnelling microscopy	-
dc.subject	tungsten disulphide	-
dc.subject	catalysis	-
dc.title	Defeitos superficiais em 2H-WS2 observados por microscopia de tunelamento	-
Appears in Collections:	Chemistry

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