Please use this identifier to cite or link to this item: http://dspace.mediu.edu.my:8181/xmlui/handle/123456789/4113
Title: Modelagem dos processos químicos em plasmas de misturas gasosas usadas na corrosão de silício. Parte 2: SF6 / O2
Keywords: plasma etching
numerical modeling
SF6 decomposition
Issue Date: 30-May-2013
Publisher: Sociedade Brasileira de Química
Description: In this work, a numerical modeling analysis of the gas-phase decomposition of SF6 / O2 mixtures, in the presence of silicon, was performed. The relative importance of individual processes and the effect of the parameters' uncertainties were determined. The model was compared with experimental data for the plasma etching of silicon and with the calculated results for the CF4 / O2 system. In both systems the main etching agent is the fluorine atom and the concentration of the major species depends on the composition of the mixture. The etching rate is greater for SF6 / O2.
URI: http://koha.mediu.edu.my:8181/jspui/handle/123456789/4113
Other Identifiers: http://www.scielo.br/scielo.php?script=sci_arttext&pid=S0100-40421998000100006
http://www.doaj.org/doaj?func=openurl&genre=article&issn=01004042&date=1998&volume=21&issue=1&spage=34
Appears in Collections:Chemistry

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