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http://dspace.mediu.edu.my:8181/xmlui/handle/123456789/8069| Title: | Radiation-induced errors in memory chips |
| Issue Date: | 1-Jun-2013 |
| Publisher: | Sociedade Brasileira de Física |
| Description: | We have measured probabilities for proton, neutron and pion beams from accelerators to induce temporary or soft errors in a wide range of modern 16 Mb and 64 Mb DRAM memory chips, typical of those used in aircraft electronics. Relations among the cross sections for these particles are deduced. Measurement of alpha particle yields from pions on aluminum, as a surrogate for silicon, indicate that these reaction products are the proximate cause of the charge deposition resulting in errors. |
| URI: | http://koha.mediu.edu.my:8181/jspui/handle/123456789/8069 |
| Other Identifiers: | http://www.scielo.br/scielo.php?script=sci_arttext&pid=S0103-97332003000200013 http://www.doaj.org/doaj?func=openurl&genre=article&issn=01039733&date=2003&volume=33&issue=2&spage=246 |
| Appears in Collections: | Physics and Astronomy |
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