Estimate of control voltage tolerances for a photo-electron analyzer of toroidal design

Please use this identifier to cite or link to this item: http://dspace.mediu.edu.my:8181/xmlui/handle/123456789/8357

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DC Field	Value	Language
dc.creator	Azimonte C.	-
dc.creator	Castro A. R. B. de	-
dc.creator	Tadich A.	-
dc.creator	Riley J. D.	-
dc.creator	Leckey R. C. G.	-
dc.date	2003	-
dc.date.accessioned	2013-06-01T10:56:39Z	-
dc.date.available	2013-06-01T10:56:39Z	-
dc.date.issued	2013-06-01	-
dc.identifier	http://www.scielo.br/scielo.php?script=sci_arttext&pid=S0103-97332003000400031	-
dc.identifier	http://www.doaj.org/doaj?func=openurl&genre=article&issn=01039733&date=2003&volume=33&issue=4&spage=788	-
dc.identifier.uri	http://koha.mediu.edu.my:8181/jspui/handle/123456789/8357	-
dc.description	We have run electron optics simulations and determined the tolerance in the control voltages of all elements (retarding input lens, analyzer, accelerating exit lens) of the La Trobe University photoelectron analyzer, recently redesigned to reach a spectral resolution of 5000, and which will be installed at LNLS (Campinas Brasil) and BESSY II (Berlin, Germany).	-
dc.publisher	Sociedade Brasileira de Física	-
dc.source	Brazilian Journal of Physics	-
dc.title	Estimate of control voltage tolerances for a photo-electron analyzer of toroidal design	-
Appears in Collections:	Physics and Astronomy

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