Sequential screening in semiconductor manufacturing.

Please use this identifier to cite or link to this item: http://dspace.mediu.edu.my:8181/xmlui/handle/1721.1/2427

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DC Field	Value	Language
dc.contributor	Longtin, Mark D.	-
dc.contributor	Wein, Lawrence M.	-
dc.contributor	Welsch, Roy E.	-
dc.date	2003-04-29T05:07:18Z	-
dc.date	2003-04-29T05:07:18Z	-
dc.date	2003-04-29T05:07:18Z	-
dc.date.accessioned	2013-06-01T01:19:38Z	-
dc.date.available	2013-06-01T01:19:38Z	-
dc.date.issued	2013-06-01	-
dc.identifier	# 3452-92-MSA	-
dc.identifier	http://hdl.handle.net/1721.1/2427	-
dc.identifier.uri	http://koha.mediu.edu.my:8181/jspui/handle/1721	-
dc.description	Mark D. Longtin, Lawrence M. Wein and Roy E. Welsch.	-
dc.description	Includes bibliographical references (p. 41-42).	-
dc.description	Supported by a grant from the Leaders for Manufacturing Program at MIT, and a grant from the National Science Foundation. DDM-9057297	-
dc.format	45 p.	-
dc.format	3295116 bytes	-
dc.format	application/pdf	-
dc.language	eng	-
dc.publisher	Alfred P. Sloan School of Management, Massachusetts Institute of Technology, 1992.	-
dc.relation	Working paper (Sloan School of Management) ; 3452-92.	-
dc.subject	HD28 .M414 no.3452-, 92	-
dc.title	Sequential screening in semiconductor manufacturing.	-
Appears in Collections:	MIT Items

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