Please use this identifier to cite or link to this item: http://dspace.mediu.edu.my:8181/xmlui/handle/1721.1/2670
Title: Goodness-of-fit tests for regression using kernel methods
Authors: Aït-Sahalia, Yacine.
Bickel, Peter J.
Stoker, Thomas M.
Keywords: HD28 .M414 no.3747-94
Issue Date: 5-Jun-2013
Publisher: Sloan School of Management], Massachusetts Institute of Technology
Description: Yacine Aït-Sahalia, Peter J. Bickel, Thomas M. Stoker.
Cover title.
Includes bibliographical references (p. 27-30).
URI: http://koha.mediu.edu.my:8181/xmlui/handle/1721
Other Identifiers: #3747
http://hdl.handle.net/1721.1/2670
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