Goodness-of-fit tests for regression using kernel methods

Please use this identifier to cite or link to this item: http://dspace.mediu.edu.my:8181/xmlui/handle/1721.1/2670

Full metadata record

DC Field	Value	Language
dc.contributor	Aït-Sahalia, Yacine.	-
dc.contributor	Bickel, Peter J.	-
dc.contributor	Stoker, Thomas M.	-
dc.date	2003-04-29T05:15:09Z	-
dc.date	2003-04-29T05:15:09Z	-
dc.date	1994	-
dc.date.accessioned	2013-06-04T16:15:07Z	-
dc.date.available	2013-06-04T16:15:07Z	-
dc.date.issued	2013-06-05	-
dc.identifier	#3747	-
dc.identifier	http://hdl.handle.net/1721.1/2670	-
dc.identifier.uri	http://koha.mediu.edu.my:8181/xmlui/handle/1721	-
dc.description	Yacine Aït-Sahalia, Peter J. Bickel, Thomas M. Stoker.	-
dc.description	Cover title.	-
dc.description	Includes bibliographical references (p. 27-30).	-
dc.format	30 p.	-
dc.format	2523559 bytes	-
dc.format	application/pdf	-
dc.language	eng	-
dc.publisher	Sloan School of Management], Massachusetts Institute of Technology	-
dc.relation	Working paper (Sloan School of Management) ; 3747-94.	-
dc.subject	HD28 .M414 no.3747-94	-
dc.title	Goodness-of-fit tests for regression using kernel methods	-
Appears in Collections:	MIT Items

Files in This Item:

There are no files associated with this item.

DSpace JSPUI