Metrics : you are what you measure!

Please use this identifier to cite or link to this item: http://dspace.mediu.edu.my:8181/xmlui/handle/1721.1/2703

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DC Field	Value	Language
dc.contributor	Hauser, John R.	-
dc.contributor	Katz, Gerald M.	-
dc.contributor	Sloan School of Management.	-
dc.contributor	International Center for Research on the Management of Technology.	-
dc.date	2003-04-29T05:16:08Z	-
dc.date	2003-04-29T05:16:08Z	-
dc.date	1998	-
dc.date	1998	-
dc.date.accessioned	2013-06-04T16:15:14Z	-
dc.date.available	2013-06-04T16:15:14Z	-
dc.date.issued	2013-06-05	-
dc.identifier	#4009	-
dc.identifier	http://hdl.handle.net/1721.1/2703	-
dc.identifier.uri	http://koha.mediu.edu.my:8181/xmlui/handle/1721	-
dc.description	John R. Hauser, Gerald M. Katz.	-
dc.description	Title from cover. "January, 1998."	-
dc.description	Includes bibliographical references (p. 26-27).	-
dc.format	27 p.	-
dc.format	2201647 bytes	-
dc.format	application/pdf	-
dc.language	eng	-
dc.publisher	Sloan School of Management, Massachusetts Institute of Technology	-
dc.relation	WP (International Center for Research on the Management of Technology) ; 172-98	-
dc.relation	Working paper (Sloan School of Management) ; WP 4009-98.	-
dc.subject	HD28 .M414 no.4009-98	-
dc.title	Metrics : you are what you measure!	-
Appears in Collections:	MIT Items

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