Please use this identifier to cite or link to this item:
http://dspace.mediu.edu.my:8181/xmlui/handle/1721.1/4112| Title: | ERNI-3D : a technology-generic tool for interconnect reliability projections in 3D integrated circuits Technology-generic tool for interconnect reliability projections in 3D integrated circuits |
| Authors: | Alam, Syed Mohiul, 1975- |
| Issue Date: | 9-Oct-2013 |
| Description: | by Syed Mohiul Alam. Supervised by Donald E. Troxel and Carl V. Thompson. Also issued as Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2001. Includes bibliographical references (p. 107-112). |
| URI: | http://koha.mediu.edu.my:8181/xmlui/handle/1721 |
| Other Identifiers: | http://hdl.handle.net/1721.1/4112 |
| Appears in Collections: | MIT Items |
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