Please use this identifier to cite or link to this item: http://dspace.mediu.edu.my:8181/xmlui/handle/1957/445
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dc.contributorMayaram, Kartikeya-
dc.contributorMoon, Un-Ku-
dc.contributorJander, Albrecht-
dc.contributorKimura, Shoichi-
dc.date2005-09-13T20:38:28Z-
dc.date2005-09-13T20:38:28Z-
dc.date2005-08-23-
dc.date2005-09-13T20:38:28Z-
dc.date.accessioned2013-10-16T07:27:14Z-
dc.date.available2013-10-16T07:27:14Z-
dc.date.issued2013-10-16-
dc.identifierhttp://hdl.handle.net/1957/445-
dc.identifier.urihttp://koha.mediu.edu.my:8181/xmlui/handle/1957/445-
dc.descriptionGraduation date: 2006-
dc.descriptionSpacecrafts experience radiation in the course of their operation and all electronic equipment on board these spacecrafts has to be designed to withstand the effects of this radiation. This thesis describes the effects of total ionization dose (TID) and single event transients (SET) in phase-locked loops - an important circuit block for communication circuits and clock generation. The design of a digital phase-locked loop made tolerant to SET through redundancy and error correction techniques has been described. Digital phase-locked loops can also incorporate self-calibration techniques to compensate for the effects of TID. A linear analysis is presented for the design of digital phase-locked loops. This digital phase-locked loop was fabricated in the Honeywell 0.35 μm SOI CMOS process.-
dc.languageen_US-
dc.subjectRadiation hardened-
dc.subjectPhase-locked loops-
dc.titleDesign techniques for radiation hardened-phase locked loops-
dc.typeThesis-
Appears in Collections:ScholarsArchive@OSU

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