| dc.creator |
El Rifai, Khalid |
|
| dc.creator |
El Rifai, Osamah M. |
|
| dc.creator |
Youcef-Toumi, Kamal |
|
| dc.date |
2003-12-15T12:00:00Z |
|
| dc.date |
2003-12-15T12:00:00Z |
|
| dc.date |
2004-01 |
|
| dc.date.accessioned |
2013-10-09T02:33:10Z |
|
| dc.date.available |
2013-10-09T02:33:10Z |
|
| dc.date.issued |
2013-10-09 |
|
| dc.identifier |
http://hdl.handle.net/1721.1/3914 |
|
| dc.identifier.uri |
http://koha.mediu.edu.my:8181/xmlui/handle/1721 |
|
| dc.description |
In this paper, the problem of dual actuation in the atomic force microscope (AFM) is analyzed. The use of two actuators to balance the trade-off between bandwidth, range, and precision has been recently extended to nano-positioning systems. Despite existing demands, this concept undergoes fundamental limitations towards its extension to AFMs. This is attributed to the non-conventional requirement imposed on the control signal response, as it used to create the image of the characterized surface. |
|
| dc.description |
Singapore-MIT Alliance (SMA) |
|
| dc.format |
324338 bytes |
|
| dc.format |
application/pdf |
|
| dc.language |
en_US |
|
| dc.relation |
Innovation in Manufacturing Systems and Technology (IMST); |
|
| dc.subject |
dual actuation |
|
| dc.subject |
atomic force microscope |
|
| dc.subject |
piezotube |
|
| dc.subject |
piezocantilever |
|
| dc.subject |
plant transfer functions |
|
| dc.subject |
feedback systems |
|
| dc.title |
On Dual Actuation in Atomic Force Microscopes |
|
| dc.type |
Article |
|