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Substrate Resistance Extraction Using a Multi-Domain Surface Integral Formulation

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dc.creator Vithayathil, Anne
dc.creator Hu, Xin
dc.creator White, Jacob K.
dc.date 2003-12-15T20:45:35Z
dc.date 2003-12-15T20:45:35Z
dc.date 2004-01
dc.date.accessioned 2013-10-09T02:33:13Z
dc.date.available 2013-10-09T02:33:13Z
dc.date.issued 2013-10-09
dc.identifier http://hdl.handle.net/1721.1/3923
dc.identifier.uri http://koha.mediu.edu.my:8181/xmlui/handle/1721
dc.description In order to assess and optimize layout strategies for minimizing substrate noise, it is necessary to have fast and accurate techniques for computing contact coupling resistances associated with the substrate. In this talk, we describe an extraction method capable of full-chip analysis which combines modest geometric approximations, a novel integral formulation, and an FFT-accelerated preconditioned iterative method.
dc.description Singapore-MIT Alliance (SMA)
dc.format 10535 bytes
dc.format application/pdf
dc.language en_US
dc.relation High Performance Computation for Engineered Systems (HPCES);
dc.subject substrate resistance extraction
dc.subject multi-domain surface integral formulation
dc.subject substrate noise
dc.subject coupling resistances
dc.title Substrate Resistance Extraction Using a Multi-Domain Surface Integral Formulation
dc.type Article


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