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Si Industry at a Crossroads: New Materials or New Factories?

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dc.creator Fitzgerald, Eugene A.
dc.creator Leitz, Christopher W.
dc.creator Lee, Minjoo L.
dc.creator Antoniadis, Dimitri A.
dc.creator Currie, Matthew T.
dc.date 2003-12-22T20:50:12Z
dc.date 2003-12-22T20:50:12Z
dc.date 2002-01
dc.date.accessioned 2013-10-09T02:33:27Z
dc.date.available 2013-10-09T02:33:27Z
dc.date.issued 2013-10-09
dc.identifier http://hdl.handle.net/1721.1/3987
dc.identifier.uri http://koha.mediu.edu.my:8181/xmlui/handle/1721
dc.description Many trends in the silicon industry could be interpreted as the herald of the end of traditional Si scaling. If this premise holds, future performance and system-on-chip applications may not be reached with conventional Si technology extensions. We review progress towards our vision that a larger crystal structure on Si, namely relaxed SiGe epitaxial layers, can support many generations of higher performance Si CMOS and new system-on-chip functionality without the expense of significant new equipment and change to CMOS manufacturing ideology. We will review the impact of tensile strained Si layers grown on relaxed SiGe layers. Both NMOS and PMOS exhibit higher carrier mobilities due to the strained Si MOSFET channel. Heterostructure MOSFETs designed on relaxed SiGe can have multiple-generation performance increases, and therefore determine a new performance roadmap for Si CMOS technology, independent of MOSFET gate length. We also indicate that this materials platform naturally leads to incorporating new optical functionality into Si CMOS technology.
dc.description Singapore-MIT Alliance (SMA)
dc.format 152274 bytes
dc.format application/pdf
dc.language en_US
dc.relation Advanced Materials for Micro- and Nano-Systems (AMMNS);
dc.subject strained-Si
dc.subject SiGe
dc.subject MOSFET
dc.subject mobility
dc.subject inverter
dc.subject frequency
dc.subject power
dc.title Si Industry at a Crossroads: New Materials or New Factories?
dc.type Article


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