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Modeling generalized stacking fault in Au using tight-binding potential combined with a simulated annealing method

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dc.creator Cai, Jun
dc.creator Wang, Jian-Sheng
dc.date 2003-12-23T02:39:37Z
dc.date 2003-12-23T02:39:37Z
dc.date 2002-01
dc.date.accessioned 2013-10-09T02:33:40Z
dc.date.available 2013-10-09T02:33:40Z
dc.date.issued 2013-10-09
dc.identifier http://hdl.handle.net/1721.1/4005
dc.identifier.uri http://koha.mediu.edu.my:8181/xmlui/handle/1721
dc.description Tight-binding potential combined with a simulated annealing method is used to study the generalized stacking fault structure and energy of gold. The potential is chosen to fit band structures and total energies from a set of first-principles calculations (Phys. Rev. B54, 4519 (1996)). It is found that the relaxed stacking fault energy (SFE) and anti-SFE are equal to 46 and 102 mJ/m², respectively, and in good agreement with the first principles calculations and experiment. In addition, the potential predicts that the c/a of hcp-like stacking fault structure in Au is slightly smaller than the ideal one.
dc.description Singapore-MIT Alliance (SMA)
dc.format 188138 bytes
dc.format application/pdf
dc.language en_US
dc.relation High Performance Computation for Engineered Systems (HPCES);
dc.subject generalized stacking fault
dc.subject tight-binding potential
dc.subject Au
dc.title Modeling generalized stacking fault in Au using tight-binding potential combined with a simulated annealing method
dc.type Article


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