| dc.contributor |
Alam, Syed Mohiul, 1975- |
|
| dc.date |
2004-03-02T18:26:26Z |
|
| dc.date |
2004-03-02T18:26:26Z |
|
| dc.date |
2001 |
|
| dc.date |
2001 |
|
| dc.date.accessioned |
2013-10-09T02:34:03Z |
|
| dc.date.available |
2013-10-09T02:34:03Z |
|
| dc.date.issued |
2013-10-09 |
|
| dc.identifier |
http://hdl.handle.net/1721.1/4112 |
|
| dc.identifier.uri |
http://koha.mediu.edu.my:8181/xmlui/handle/1721 |
|
| dc.description |
by Syed Mohiul Alam. |
|
| dc.description |
Supervised by Donald E. Troxel and Carl V. Thompson. |
|
| dc.description |
Also issued as Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2001. |
|
| dc.description |
Includes bibliographical references (p. 107-112). |
|
| dc.format |
112 p. |
|
| dc.format |
7027671 bytes |
|
| dc.format |
application/pdf |
|
| dc.language |
eng |
|
| dc.relation |
Technical report (Massachusetts Institute of Technology. Research Laboratory of Electronics) ; 652. |
|
| dc.title |
ERNI-3D : a technology-generic tool for interconnect reliability projections in 3D integrated circuits |
|
| dc.title |
Technology-generic tool for interconnect reliability projections in 3D integrated circuits |
|