| dc.contributor |
Eisenstein, A. S. |
|
| dc.date |
2004-03-03T22:19:04Z |
|
| dc.date |
2004-03-03T22:19:04Z |
|
| dc.date |
1946 |
|
| dc.date.accessioned |
2013-10-09T02:37:20Z |
|
| dc.date.available |
2013-10-09T02:37:20Z |
|
| dc.date.issued |
2013-10-09 |
|
| dc.identifier |
no. 17 |
|
| dc.identifier |
http://hdl.handle.net/1721.1/5029 |
|
| dc.identifier.uri |
http://koha.mediu.edu.my:8181/xmlui/handle/1721 |
|
| dc.description |
[by] A. Eisenstein. |
|
| dc.description |
"Reprinted from Journal of applied physics, vol. 17, No. 11, 874-878, November, 1946." |
|
| dc.description |
Includes bibliographical references. |
|
| dc.format |
p. 874-878 |
|
| dc.format |
487443 bytes |
|
| dc.format |
application/pdf |
|
| dc.language |
eng |
|
| dc.publisher |
Research Laboratory of Electronics, Massachusetts Institute of Technology |
|
| dc.relation |
Technical report (Massachusetts Institute of Technology. Research Laboratory of Electronics) ; 17. |
|
| dc.subject |
TK7855.M41 R43 no.17 |
|
| dc.subject |
Thin films |
|
| dc.title |
An x-ray method for measuring the thickness of thin crystalline films |
|