On Optimum Recognition Error and Reject Tradeoff

dc.creator	Chow, C.K.
dc.date	2004-10-04T14:44:17Z
dc.date	2004-10-04T14:44:17Z
dc.date	1969-04-01
dc.date.accessioned	2013-10-09T02:43:47Z
dc.date.available	2013-10-09T02:43:47Z
dc.date.issued	2013-10-09
dc.identifier	AIM-175
dc.identifier	http://hdl.handle.net/1721.1/6177
dc.identifier.uri	http://koha.mediu.edu.my:8181/xmlui/handle/1721
dc.description	The performance of a pattern recognition system is characterized by its error and reject tradeoff. This paper describes an optimum rejection rule and presents a general relation between the error and reject probabilities and some simple properties of the tradeoff in the optimum recognition system. The error rate can be directly evaluated from the reject function. Some practical implications of the results are discussed. Examples in normal distributions and uniform distributions are given.
dc.format	15774124 bytes
dc.format	671679 bytes
dc.format	application/postscript
dc.format	application/pdf
dc.language	en_US
dc.relation	AIM-175
dc.title	On Optimum Recognition Error and Reject Tradeoff

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