Graduation date: 2006
Spacecrafts experience radiation in the course of their operation
and all electronic equipment on board these spacecrafts has to
be designed to withstand the effects of this radiation.
This thesis describes the effects of total ionization dose (TID)
and single event transients (SET) in phase-locked loops - an
important circuit block for communication circuits and clock generation.
The design of a digital phase-locked loop made tolerant to SET
through redundancy and error correction techniques has been described.
Digital phase-locked loops can also incorporate self-calibration
techniques to compensate for the effects of TID.
A linear analysis is presented for the design of digital phase-locked loops.
This digital phase-locked loop was fabricated in the Honeywell 0.35 μm SOI
CMOS process.